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Materials Characterization provides unique tools for understanding the materials and their demonstrated properties. Materials Characterization techniques, such as x-ray diffraction, scanning electron microscopy, and transmission electron microscopy, allow detailed structural, chemical, and morphological characteristics of materials to be determined, which has become essential tools for materials research and their productions.

This is vital for developing new material systems, and for identifying problems in the production lines. For this reason, demand for learning various materials characterization techniques have increased sharply in the recent decades.

UQ Search this site Search UQ Home Starting at UQ Programs and courses Faculties and schools HomeAdvanced Materials Characterization Print Feedback Advanced Materials Characterization (MATE7014) Course level Postgraduate Coursework Faculties are the major organisational units with responsibility for academic programs.

Faculties may have a number of sub-units called schools. The head of a faculty is called an Executive Dean. Course coordinators and lecturers generally work in schools. A standard study load is 8 units per semester. In mySI-net, this is represented by a combination of letters and figures within brackets.

For example (2L1T3P) means you have 2 hours of lecture, a one hour tutorial and a 3 hour practical (laboratory) each week. Current course offerings Course offerings Location internal (on-campus), external (off-campus or online), or intensive. Course description Materials Characterization provides unique tools for understanding the materials and their demonstrated properties. Archived offerings Course offerings Location internal (on-campus), external (off-campus or online), or intensive.

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To obtain theoretical and practical knowledge and insight in microscopy and diffraction techniques for the study of materials. To make the students familiar with the basics of the microscopic and diffraction techniques taught in the course and to illustrate some pratical aspects of these techniques.

This course unit is a prerequisite for taking the following course units:H00B3C : Project Work and Problem Solving Linked to the Core Courses: Part IIMaster in de nanowetenschappen, nanotechnologie en nano-engineering (Leuven) 120 ects.

Master in de nanowetenschappen, nanotechnologie en nano-engineering (Leuven) (Optie Nanomaterialen en nanochemie) 120 ects. Master of Nanoscience, Nanotechnology and Nanoengineering (Leuven) 120 ects.

Master of Nanoscience, Nanotechnology and Nanoengineering (Leuven) (Option: Nanomaterials and Nanochemistry) 120 ects.

Courses for Exchange Students Faculty of Engineering Science (Leuven)Erasmus Mundus Master of Science in Nanoscience and Nanotechnology (Leuven et al) 120 ects. Optical microscopy, Scanning probe microscopy, Electron microscopy (both SEM and TEM), Ion miroscopy and Diffraction techniques such as X-ray Diffraction, Neutron diffraction and electron diffraction. Microstructural Characterization of Materials, D. Wild, Institute of Physics PublishingPhysical Principles of Electron Microscopy, R.

Egerton, Springer VerlagThe theoretical and pratical aspects of the microscopy and diffraction techniques are lectured. Firstly, the basics of the microscopy and diffraction are explained. Subsequently, the principle of the techniques is discussed together with the technical layout, the potential and limites of the techniques. H01J4A : Materials Characterisation Techniques IDemo session of electron microscopy, focused ion beam and exercise sessions on x-ray diffraction.

Wild, Institute of Physics Publishing In small groups students will see a SEM and focused-ion beam (FIB) in operation. How these techniques are used for materials characterization will be demonstrated.

For x-ray diffraction (XRD), after a short repetition of the theoretical background the students will work out in small groups an assignment, which includes an example of a XRD pattern that needs to be analysed.

Order of EnrolmentThis course unit is a prerequisite for taking the following course units:H00B3C : Project Work and Problem Solving Linked to the Core Courses: Part IIIs included in these courses of studyMaster in de nanowetenschappen, nanotechnologie en nano-engineering (Leuven) 120 ects. Materials Characterization Techniques I: Microscopy and Diffraction: Lecture (B-KUL-H09W7a)2 ECTSEnglishFormat: Lecture20 Second termSeo Jin Won ContentCourse materialFormat: more information Is also included in other courses ContentOptical microscopy, Scanning probe microscopy, Electron microscopy (both SEM and TEM), Ion miroscopy and Diffraction techniques such as X-ray Diffraction, Neutron diffraction and electron diffraction.

Course materialMicrostructural Characterization of Materials, D. Egerton, Springer VerlagFormat: more information The theoretical and pratical aspects of the microscopy and diffraction techniques are lectured.

Is also included in other courses H01J4A : Materials Characterisation Techniques I1 ects.